Serveur d'exploration sur l'Indium

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Sputtered ITO for application in thin-film silicon solar cells: Relationship between structural and electrical properties

Identifieur interne : 000505 ( Main/Repository ); précédent : 000504; suivant : 000506

Sputtered ITO for application in thin-film silicon solar cells: Relationship between structural and electrical properties

Auteurs : RBID : Pascal:13-0188484

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English descriptors

Abstract

Indium tin oxide (ITO) thin films for application in thin-film silicon solar cells with superior electrical and optical properties (resistivity ranging from 1.4 to 8.4 x 10-4 Ω cm; transparency of >80%) have been investigated. ITO layers were deposited by radio-frequency (RF) magnetron sputtering process at different argon gas pressures and substrate temperatures ranging from room temperature to 280°C. The main goal was to identify the relationship between structural and electrical properties. Generally, ITO layers were rather smooth with granular topography; electro-optically superior layers exhibited substantially different surface morphology of large, well-organized domain formations. Hall mobility of remarkably high value of 49 cm2/V s (resistivity of 2.6 x 10-4 Ω cm) was achieved for the ITO layers, which were deposited at surprisingly low temperature of 125 °C. ITO process has been successfully applied, even at room temperature, to fabricate front contacts for microcrystalline silicon solar cells, exhibiting excellent performance on both rigid and flexible substrates.

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Pascal:13-0188484

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<div type="abstract" xml:lang="en">Indium tin oxide (ITO) thin films for application in thin-film silicon solar cells with superior electrical and optical properties (resistivity ranging from 1.4 to 8.4 x 10
<sup>-4</sup>
Ω cm; transparency of >80%) have been investigated. ITO layers were deposited by radio-frequency (RF) magnetron sputtering process at different argon gas pressures and substrate temperatures ranging from room temperature to 280°C. The main goal was to identify the relationship between structural and electrical properties. Generally, ITO layers were rather smooth with granular topography; electro-optically superior layers exhibited substantially different surface morphology of large, well-organized domain formations. Hall mobility of remarkably high value of 49 cm
<sup>2</sup>
/V s (resistivity of 2.6 x 10
<sup>-4</sup>
Ω cm) was achieved for the ITO layers, which were deposited at surprisingly low temperature of 125 °C. ITO process has been successfully applied, even at room temperature, to fabricate front contacts for microcrystalline silicon solar cells, exhibiting excellent performance on both rigid and flexible substrates.</div>
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<sup>2</sup>
/V s (resistivity of 2.6 x 10
<sup>-4</sup>
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<s5>14</s5>
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<s5>15</s5>
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<s5>32</s5>
</fC03>
<fC03 i1="17" i2="X" l="FRE">
<s0>8460J</s0>
<s2>PAC</s2>
<s4>INC</s4>
<s5>45</s5>
</fC03>
<fC03 i1="18" i2="X" l="FRE">
<s0>7361</s0>
<s2>PAC</s2>
<s4>INC</s4>
<s5>46</s5>
</fC03>
<fC03 i1="19" i2="X" l="FRE">
<s0>6855J</s0>
<s2>PAC</s2>
<s4>INC</s4>
<s5>47</s5>
</fC03>
<fN21>
<s1>168</s1>
</fN21>
</pA>
</standard>
</inist>
</record>

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